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A New EMC Challenge: Intra-system EMI and RF Interference
Author(s): 
Pages: 9-10
Year: Issue:  3
Journal: Safety & EMC

Abstract: 在过去的20年中,针对消费电子的电磁兼容(EMC)设计领域经历了一个重要进程,包括对耦合原理的理解,开发有效的测量和建模技术,以及工程设计导则等.随着数据率和电路密度持续增加,出现了一系列EMC方面的新挑战,特别是系统内电磁干扰(EMI),可能对现今的计算、信息和通信等各类应用中的高速电子元件和系统产生显著影响.
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