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Application of AFM in Microstructure Analysis of Materials at Baosteel
Author(s): 
Pages: 35-39
Year: Issue:  z1
Journal: BAOSTEEL TECHNOLOGY

Keyword:  原子力显微镜显微结构应用;
Abstract: 作为扫描力探针显微镜(SPM--SCAN PROBE MICROSCOPE)的重要成员,原子力显微镜(AFM--ATOMIC FORCE MICROSCOPE)不仅是重要的纳米材料表征的手段,而且在钢铁行业中也有着令人兴奋的应用前景,文章通过一些典型试验说明这台设备在钢铁材料显微研究中的重要作用.
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